High-Throughput Transmission Electron Microscope
The Spectra 300C is a next-generation high-throughput transmission electron microscope. The Spectra’s high brightness X-CFEG field emission gun offers high current in a focused electron probe for 4DSTEM acquisition. This tool is equipped with the latest software and hardware to enable rapid microED data collection, single particle data analysis, and DPC phase determination at liquid nitrogen temperature. Electron microscopy excels at detecting atomic periodicities smaller than 1 Å. Using electron diffraction, ab initio determination of molecular structures at this scale can be determined. Using microED, better than ~0.8 Å periodicities can be determined in crystals too small to be analyzed using traditional x-ray techniques. When no crystal structure is present, single particle analysis can be utilized for structure determination. Other characterization methods are available as well.
Key features:
- 30, 60, 120 to 300 kV Alignments
- C-TWIN Lens, Gap = 11 mm, Cs = 2.7 mm
- X-CFEG Cold Field Emission Gun
- Piezo and Motor Driven Computer-controlled Compustage
- +/- 80° single tilt Gatan Elsa Cryo-Transfer holder
- +/- 60/20° dual tilt analytical holder
- +/- 60/20° dual tilt Gatan 915 Cryo-Transfer holder
- STEM, Panther Detector, HAADF, iDPC
- Ceta-D High Speed (4k x 4k, 40 fps)
- Falcon 3 counting camera
- 4DSTEM package
- MicroED Package (small beam blocker)
- S/TEM tomography package
- Velox, image analysis software (TFS)
- 5th Generation Octagon with fast kV changes
